Evolution of the gate current in 32 nm MOSFETs under irradiation

Fil: Palumbo, Félix Roberto Mario. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Tecnológica Nacional; Argentina. Comisión Nacional de Energía Atómica; Argentina

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Bibliographic Details
Main Authors: Palumbo, Félix Roberto Mario, Debray, Mario Ernesto, Vega, Nahuel Agustín, Quinteros, Cynthia Paula, Kalstein, Ariel, Guarin, F.
Published: Pergamon-Elsevier Science Ltd 2016
Online Access:https://nuclea.cnea.gob.ar/handle/20.500.12553/8358
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author Palumbo, Félix Roberto Mario
Debray, Mario Ernesto
Vega, Nahuel Agustín
Quinteros, Cynthia Paula
Kalstein, Ariel
Guarin, F.
author_browse Debray, Mario Ernesto
Guarin, F.
Kalstein, Ariel
Palumbo, Félix Roberto Mario
Quinteros, Cynthia Paula
Vega, Nahuel Agustín
author_facet Palumbo, Félix Roberto Mario
Debray, Mario Ernesto
Vega, Nahuel Agustín
Quinteros, Cynthia Paula
Kalstein, Ariel
Guarin, F.
author_sort Palumbo, Félix Roberto Mario
collection DSpace
description Fil: Palumbo, Félix Roberto Mario. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Tecnológica Nacional; Argentina. Comisión Nacional de Energía Atómica; Argentina
id dspace-20.500.12553-8358
institution Repositorio Institucional NUCLEA
publishDate 2016
publishDateSort 2016
publisher Pergamon-Elsevier Science Ltd
publisherStr Pergamon-Elsevier Science Ltd
record_format dspace
spellingShingle Palumbo, Félix Roberto Mario
Debray, Mario Ernesto
Vega, Nahuel Agustín
Quinteros, Cynthia Paula
Kalstein, Ariel
Guarin, F.
Evolution of the gate current in 32 nm MOSFETs under irradiation
thumbnail https://nuclea.cnea.gob.ar/server/api/core/bitstreams/654b8b31-5785-4628-b4d9-2363a73db72e/content
title Evolution of the gate current in 32 nm MOSFETs under irradiation
title_full Evolution of the gate current in 32 nm MOSFETs under irradiation
title_fullStr Evolution of the gate current in 32 nm MOSFETs under irradiation
title_full_unstemmed Evolution of the gate current in 32 nm MOSFETs under irradiation
title_short Evolution of the gate current in 32 nm MOSFETs under irradiation
title_sort evolution of the gate current in 32 nm mosfets under irradiation
url https://nuclea.cnea.gob.ar/handle/20.500.12553/8358
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