Palumbo, F. R. M., Debray, M. E., Vega, N. A., Quinteros, C. P., Kalstein, A., & Guarin, F. (2016). Evolution of the gate current in 32 nm MOSFETs under irradiation. Pergamon-Elsevier Science Ltd.
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Chicago Style (17th ed.) Citation
Palumbo, Félix Roberto Mario, Mario Ernesto Debray, Nahuel Agustín Vega, Cynthia Paula Quinteros, Ariel Kalstein, and F. Guarin. Evolution of the Gate Current in 32 Nm MOSFETs Under Irradiation. Pergamon-Elsevier Science Ltd, 2016.
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MLA (9th ed.) Citation
Palumbo, Félix Roberto Mario, et al. Evolution of the Gate Current in 32 Nm MOSFETs Under Irradiation. Pergamon-Elsevier Science Ltd, 2016.
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Warning: These citations may not always be 100% accurate.