Evolution of the gate current in 32 nm MOSFETs under irradiation
Fil: Palumbo, Félix Roberto Mario. Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina. Universidad Tecnológica Nacional; Argentina. Comisión Nacional de Energía Atómica; Argentina
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| Main Authors: | , , , , , |
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| Published: |
Pergamon-Elsevier Science Ltd
2016
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| Online Access: | https://nuclea.cnea.gob.ar/handle/20.500.12553/8358 |
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