Diffraction and imaginig techniques in material science

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Bibliographic Details
Other Authors:	Amelinckx, S. (Ed.), Gevers, R. (Ed.), Van Landuyt, J. (Ed.)
Format:	Book
Language:	English
Published:	Amsterdam: North-Holland, 1978.
Edition:	2a ed
Subjects:	MICROSCOPIA ELECTRONICA ELECTRON MICROSCOPY LOW ENERGY ELECTRON DIFFRACTION DIFRACCION DE ELECTRONES DE BAJA ENERGIA DIFRACCION DE RAYOS X X-RAY DIFFRACTION FIELD EMISSION MICROSCOPY MICROSCOPIA DE EMISION DE CAMPO MIRROR ELECTRON MICROSCOPY
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Holdings details from Centro de Información Eduardo Savino
Call Number:	537.533.73 Am32 vol II
Copy	On Shelf