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Diffraction and imaginig techniques in material science

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Other Authors: Amelinckx, S. (Ed.), Gevers, R. (Ed.), Van Landuyt, J. (Ed.)
Format: Book
Language:English
Published: Amsterdam: North-Holland, 1978.
Edition:2a ed
Subjects:
MICROSCOPIA ELECTRONICA
ELECTRON MICROSCOPY
LOW ENERGY ELECTRON DIFFRACTION
DIFRACCION DE ELECTRONES DE BAJA ENERGIA
DIFRACCION DE RAYOS X
X-RAY DIFFRACTION
FIELD EMISSION MICROSCOPY
MICROSCOPIA DE EMISION DE CAMPO
MIRROR ELECTRON MICROSCOPY
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Physical Description:vol II, ix, 457-847 p.: fot., graf.;
ISBN:0444851291

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