Scanning electron microscopy and x-ray microanalysis.

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Bibliographic Details
Main Author:	Goldstein, Joseph
Other Authors:	Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M, Scott, John Henry J., Joy, David C.
Format:	Electronic
Language:	English
Published:	New York, NY : Springer Science+Business Media, LLC, 2018.
Edition:	4th ed.
Subjects:	ION BEAMS HACES DE IONES Electron backscatter diffraction Environmental SEM Qualitative X-ray analysis Quantitative X-ray analysis X-ray mapping
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999			\|c 32982 \|d 32982
020			\|a 9781493966745
042			\|a pcc
100	1		\|a Goldstein, Joseph. \|9 3650
245	1	0	\|a Scanning electron microscopy and x-ray microanalysis.
250			\|a 4th ed.
264		1	\|a New York, NY : \|b Springer Science+Business Media, LLC, \|c 2018.
300			\|a 554 p. \|b il.
650		7	\|2 inist \|a ION BEAMS \|9 3656
650		7	\|2 inist \|a HACES DE IONES \|9 3657
653			\|a Electron backscatter diffraction
653			\|a Environmental SEM
653			\|a Qualitative X-ray analysis
653			\|a Quantitative X-ray analysis
653			\|a X-ray mapping
700	1		\|a Newbury, Dale E. \|9 3651
700	1		\|a Michael, Joseph R. \|9 3652
700	1		\|a Ritchie, Nicholas W.M. \|9 3653
700	1		\|a Scott, John Henry J. \|9 3654
700	1		\|a Joy, David C. \|9 3655
856			\|y Solicitar libro electrónico a bibliotecacies@cnea.gob.ar
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