Goldstein, J., Newbury, D. E., Michael, J. R., Ritchie, N. W., Scott, J. H. J., & Joy, D. C. (2018). Scanning electron microscopy and x-ray microanalysis (4th ed.). Springer Science+Business Media, LLC.
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Chicago Style (17th ed.) Citation
Goldstein, Joseph, Dale E. Newbury, Joseph R. Michael, Nicholas W.M Ritchie, John Henry J. Scott, and David C. Joy. Scanning Electron Microscopy and X-ray Microanalysis. 4th ed. New York, NY: Springer Science+Business Media, LLC, 2018.
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MLA (9th ed.) Citation
Goldstein, Joseph, et al. Scanning Electron Microscopy and X-ray Microanalysis. 4th ed. Springer Science+Business Media, LLC, 2018.
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Warning: These citations may not always be 100% accurate.