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Scanning electron microscopy and x-ray microanalysis.

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Main Author: Goldstein, Joseph
Other Authors: Newbury, Dale E., Michael, Joseph R., Ritchie, Nicholas W.M, Scott, John Henry J., Joy, David C.
Format: Electronic
Language:English
Published: New York, NY : Springer Science+Business Media, LLC, 2018.
Edition:4th ed.
Subjects:
ION BEAMS
HACES DE IONES
Electron backscatter diffraction
Environmental SEM
Qualitative X-ray analysis
Quantitative X-ray analysis
X-ray mapping
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Physical Description:554 p. il.
ISBN:9781493966745

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