Physical aspects of electron microscopy and microbeam analysis.

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Bibliographic Details
Main Author: Siegel, Benjamin M. (ed.)
Other Authors: Beaman, Donald R.
Format: Book
Published: [s.l.] : [s.n.], c1975.
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Centro de Información Eduardo Savino

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Call Number: 621.385.833.2: 535.3 S4
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