Siegel, B. M., & Beaman, D. R. (1975). Physical aspects of electron microscopy and microbeam analysis. [s.n.].
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Chicago Style (17th ed.) Citation
Siegel, Benjamin M., and Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. [s.l.]: [s.n.], 1975.
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MLA (9th ed.) Citation
Siegel, Benjamin M., and Donald R. Beaman. Physical Aspects of Electron Microscopy and Microbeam Analysis. [s.n.], 1975.
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Warning: These citations may not always be 100% accurate.