Physical aspects of electron microscopy and microbeam analysis.
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| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Published: |
[s.l.] :
[s.n.],
c1975.
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| LEADER | 00000nam a2200000 a 4500 | ||
|---|---|---|---|
| 008 | 170703t1975#### ||||f#|||||00| 0#uuu#d | ||
| 003 | AR-SmCIES | ||
| 091 | |a 618 PMM | ||
| 100 | 1 | |a Siegel, Benjamin M. |e ed. | |
| 245 | 1 | 0 | |a Physical aspects of electron microscopy and microbeam analysis. |
| 260 | |a [s.l.] : |b [s.n.], |c c1975. | ||
| 300 | |a 474 p. | ||
| 700 | 1 | |a Beaman, Donald R. | |
| 999 | |c 22297 |d 22297 | ||