Electron beam interactions with solids for microscopy, microanalysis and microlithography.

Saved in:

Bibliographic Details
Main Author:	Kyser, David F. (ed.)
Corporate Authors:	Conference on electron beam interactions with solids for microscopy, microanalysis and microlithography, Pfefferkorn conference
Format:	Conference Proceeding Book
Language:	English
Published:	AMF O'Hare, Il. : Scanning electron microscopy, c1984.
Subjects:	RADIACIONES -EFECTOS EN SOLIDOS -CONGRESOS MICROSCOPIA ELECTRONICA
Tags:	Add Tag No Tags, Be the first to tag this record!

3rd Floor Main Library

Holdings details from 3rd Floor Main Library
Call Number:	A1234.567
Copy 1	Available