Ion implantation inducing two-way shape memory effect in Cu-Al-Ni thin films
Fil: Morán, M. Comisión Nacional de Energía Atómica. Instituto Balseiro; Argentina; Universidad Nacional de Cuyo; Argentina; Consejo Nacional de Investigaciones Científicas y Técnicas; Argentina
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| Language: | English |
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Elsevier
2019
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| Online Access: | https://nuclea.cnea.gob.ar/handle/20.500.12553/5327 |
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