Diffraction and imaging techniques in material science

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Bibliographic Details
Other Authors:	Amelinckx, S. (Ed.), Gevers, R. (Ed.), Van Landuyt, J. (Ed.)
Format:	Book
Language:	English
Published:	Amsterdam: North-Holland, 1978.
Edition:	2a ed.
Subjects:	DIFFRACTION ELECTRON MICROSCOPY MICROSCOPIA ELECTRONICA ELECTRON DIFFRACTION DIFRACCION ELECTRONICA ATOMIC CLUSTERS AGRUPACIONES ATOMICAS X-RAY DIFFRACTION
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