Diffraction and imaging techniques in material science

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Bibliographic Details
Other Authors:	Amelinckx, S. (Ed.), Gevers, R. (Ed.), Van Landuyt, J. (Ed.)
Format:	Book
Language:	English
Published:	Amsterdam: North-Holland, 1978.
Edition:	2a ed.
Subjects:	DIFFRACTION ELECTRON MICROSCOPY MICROSCOPIA ELECTRONICA ELECTRON DIFFRACTION DIFRACCION ELECTRONICA ATOMIC CLUSTERS AGRUPACIONES ATOMICAS X-RAY DIFFRACTION
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245	1	0	\|a Diffraction and imaging techniques in material science
250			\|a 2a ed. \|b rev.
260			\|a Amsterdam: \|b North-Holland, \|c 1978.
300			\|a vol I, ix, 453 p.: \|b graf., fot.;
650		7	\|2 INIST \|9 2377 \|a DIFFRACTION
650		7	\|2 INIST \|9 3456 \|a ELECTRON MICROSCOPY
650		7	\|2 INIST \|9 3457 \|a MICROSCOPIA ELECTRONICA
650		7	\|2 INIST \|a ELECTRON DIFFRACTION \|9 4353
650		7	\|2 INIST \|a DIFRACCION ELECTRONICA \|9 4354
650		7	\|2 INIST \|a ATOMIC CLUSTERS \|9 4355
650		7	\|2 INIST \|a AGRUPACIONES ATOMICAS \|9 4356
650		7	\|2 INIST \|9 2904 \|a X-RAY DIFFRACTION
700			\|a Amelinckx, S. \|e Ed. \|9 4357
700			\|a Gevers, R. \|e Ed. \|9 4358
700			\|a Van Landuyt, J. \|e Ed. \|9 4359
942			\|2 udc \|c BK
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