Integrated circuit failure analysis : a guide to preparation techniques /
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| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English German |
| Published: |
Chichester ; New York :
Wiley,
c1998.
|
| Series: | Wiley series in quality and reliability engineering
|
| Subjects: | |
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| 082 | 0 | 0 | |a 621.3815 |2 21 |
| 100 | 1 | |a Beck, Friedrich. |9 38 | |
| 240 | 1 | 0 | |a Präparationstechniken für die Fehleranalyse an integrierten Halbleiterschaltungen. |l Inglés |
| 245 | 1 | 0 | |a Integrated circuit failure analysis : |b a guide to preparation techniques / |c Friedrich Beck ; translated by Stephen S. Wilson. |
| 260 | |a Chichester ; |a New York : |b Wiley, |c c1998. | ||
| 300 | |a xiv, 173 p. : |b il. ; |c 24 cm. | ||
| 440 | 0 | |a Wiley series in quality and reliability engineering |9 39 | |
| 504 | |a Incluye bibliografía e índice analítico. | ||
| 505 | 0 | |a Purpose and importance of preparatory semiconductor analysis -- Opening the package. Chip insulation -- Wet chemical etching procedures for removing layers of the chip structure -- Crystallographic etching in the silicon -- Dry etching the plasma -- Microsectioning technology, metallography -- Appendix 1: advice on health and safety at work -- Appendix 2: list of manufacturers and suppliers | |
| 650 | 0 | |a Circuitos integrados |9 40 | |
| 650 | 0 | |a SEMICONDUCTORES |9 41 | |
| 650 | 0 | |a Fallos |9 42 | |
| 650 | 0 | |a Ensayos |9 43 | |
| 650 | 0 | |a Electronica |x Confiabilidad |9 44 | |
| 942 | |2 udc |c BK | ||
| 952 | |0 0 |1 0 |2 ddc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |c NEW |d 2018-04-20 |i 51390 |l 2 |m 3 |o 621.315.59 B393 |p 51390 |r 2018-06-12 00:00:00 |s 2018-05-11 |w 2018-04-20 |y BK | ||