Characterization in compound semiconductor processing /
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
Momentum Press,
2010
|
| Series: | Material characterization series
|
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| 003 | AR-SmCIES | ||
| 005 | 20180409145606.0 | ||
| 008 | 180409b xxu||||| |||| 001 0 eng d | ||
| 999 | |c 26446 |d 26446 | ||
| 020 | |a 9781606500415 | ||
| 100 | |a Strausser, Yale |e ed. |9 36 | ||
| 245 | |a Characterization in compound semiconductor processing / |c Yale Strausser and Gary E. McGuire | ||
| 260 | 3 | |a New York : |b Momentum Press, |c 2010 | |
| 300 | |a 199 p. | ||
| 440 | |a Material characterization series |9 37 | ||
| 942 | |2 udc |c BK | ||
| 952 | |0 0 |1 0 |2 ddc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |c NEW |d 2018-04-09 |e Compra |i 51389 |l 3 |m 1 |o 621.315.59: 66.017 St912 |p 51389 |r 2024-03-05 00:00:00 |s 2024-02-07 |w 2018-04-09 |y BK | ||