Characterization in compound semiconductor processing /
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| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York :
Momentum Press,
2010
|
| Series: | Material characterization series
|
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| LEADER | 00000nam a22000007a 4500 | ||
|---|---|---|---|
| 003 | AR-SmCIES | ||
| 005 | 20180409145606.0 | ||
| 008 | 180409b xxu||||| |||| 001 0 eng d | ||
| 999 | |c 26446 |d 26446 | ||
| 020 | |a 9781606500415 | ||
| 100 | |a Strausser, Yale |e ed. |9 36 | ||
| 245 | |a Characterization in compound semiconductor processing / |c Yale Strausser and Gary E. McGuire | ||
| 260 | 3 | |a New York : |b Momentum Press, |c 2010 | |
| 300 | |a 199 p. | ||
| 440 | |a Material characterization series |9 37 | ||
| 942 | |2 udc |c BK | ||