World Conference on Non Destructive Testing <WCNDT>.

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Bibliographic Details
Corporate Authors: Trends in NDE <Non Destructive examination> Science and Technology New Delhi,IN, Proceedings of the world Conference on NDT
Format: Conference Proceeding Book
Language:English
Published: New Delhi : Oxford and IBH publishing, c1996.
Series:Krishnadas, Nair
Baldev, Raj
Murthy, C.R.L.
Jayamukar, T.
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020 |a 8120411234 
041 7 |a en   |2 ISO 639-1 
041 7 |a en   |2 ISO 639-1 
091 |a 51077 
092 |a v.1 [p.ixxxiii, 1314, I18] 
111 2 |a Trends in NDE <Non Destructive examination> Science and Technology  |c New Delhi,IN  |d 1996 
245 1 0 |a World Conference on Non Destructive Testing <WCNDT>. 
260 |a New Delhi :  |b Oxford and IBH publishing,  |c c1996. 
300 |a  v. :  |b il., tabla, diagr. 
500 |a Bibliografía al final de cada artículo 
650 4 |a ENSAYOS NO DESTRUCTIVOS 
711 2 |a Proceedings of the world Conference on NDT  |n 14  |c New Delhi,IN  |d 1996 
800 1 |a Krishnadas, Nair  |e ed. 
800 1 |a Baldev, Raj  |e ed. 
800 1 |a Murthy, C.R.L.  |e ed. 
800 1 |a Jayamukar, T.  |e ed. 
999 |c 25998  |d 25998