World Conference on Non Destructive Testing <WCNDT>.

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Bibliographic Details
Corporate Authors: Trends in NDE <Non Destructive examination> Science and Technology New Delhi,IN, Proceedings of the world Conference on NDT
Format: Conference Proceeding Book
Language:English
Published: New Delhi : Oxford and IBH publishing, c1996.
Series:Krishnadas, Nair
Baldev, Raj
Murthy, C.R.L.
Jayamukar, T.
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Description
Item Description:BibliografĂ­a al final de cada artĂ­culo
Physical Description:v. : il., tabla, diagr.
ISBN:8120411234