Accelerated testing : statistical models, test plans, and data analyses [sic].

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Bibliographic Details
Main Author: Nelson, Wayne B.
Format: Book
Language:English
Published: Hoboken, N.J. : Wiley Interscience, 2004.
Series:Wiley series in probability and statistics
Subjects:
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Description
Item Description:Ejercicios al final de cada capítulo
Apéndices y bibliografía: p.549-577
Physical Description:xiv, 601 p. : tabla, diagr.
ISBN:0471697362