Accelerated testing : statistical models, test plans, and data analyses [sic].

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Bibliographic Details
Main Author: Nelson, Wayne B.
Format: Book
Language:English
Published: Hoboken, N.J. : Wiley Interscience, 2004.
Series:Wiley series in probability and statistics
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3rd Floor Main Library

Holdings details from 3rd Floor Main Library
Call Number: A1234.567
Copy 1 Available