Quantitative Xray diffractometry.
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| Main Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
New York :
Springer,
1995.
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| Subjects: | |
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| 003 | AR-SmCIES | ||
| 020 | |a 0387945415 | ||
| 041 | 7 | |a en |2 ISO 639-1 | |
| 091 | |a 31 4 5 285 ITJS | ||
| 100 | 1 | |a Zevin, Lev S. | |
| 245 | 1 | 0 | |a Quantitative Xray diffractometry. |
| 260 | |a New York : |b Springer, |c 1995. | ||
| 300 | |a xvii, 372 p. : |b tabla, diagr. | ||
| 500 | |a Bibliografía: p.355-364 | ||
| 650 | 4 | |a DIFRACCION DE RAYOS X | |
| 650 | 4 | |a DIFRACCION DE RAYOS X -APLICACIONES INDUSTRIALES | |
| 650 | 4 | |a RAYOS X -ANALISIS | |
| 650 | 4 | |a ANALISIS CUANTITATIVO | |
| 700 | 1 | |a Kimmel, Giora | |
| 700 | 1 | |a Mureinik, Inez |e ed. | |
| 999 | |c 23652 |d 23652 | ||