Quantitative Xray diffractometry.

Saved in:
Bibliographic Details
Main Author: Zevin, Lev S.
Other Authors: Kimmel, Giora, Mureinik, Inez (ed.)
Format: Book
Language:English
Published: New York : Springer, 1995.
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Item Description:Bibliografía: p.355-364
Physical Description:xvii, 372 p. : tabla, diagr.
ISBN:0387945415