Computed electron micrographs and defect identification.
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| Main Author: | |
|---|---|
| Other Authors: | , , , |
| Format: | Book |
| Published: |
AmsterdamNew York, N.Y. :
NorthHollandAmerican Elsevier,
1973.
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| Series: | Series defects in crystalline solids, v. <7>
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| 091 | |a 26490 | ||
| 100 | 1 | |a Head, A. K. | |
| 245 | 1 | 0 | |a Computed electron micrographs and defect identification. |
| 260 | |a AmsterdamNew York, N.Y. : |b NorthHollandAmerican Elsevier, |c 1973. | ||
| 300 | |a 400 p. | ||
| 490 | 1 | |a Series defects in crystalline solids, v. <7> | |
| 700 | 1 | |a Humble, P. | |
| 700 | 1 | |a Clarebrough, L. M. | |
| 700 | 1 | |a Morton, A. J. | |
| 700 | 1 | |a Forwood, C. T. | |
| 830 | |a Series defects in crystalline solids, v. <7> | ||
| 999 | |c 22880 |d 22880 | ||
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