Head, A. K., Humble, P., Clarebrough, L. M., Morton, A. J., & Forwood, C. T. (1973). Computed electron micrographs and defect identification. NorthHollandAmerican Elsevier.
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Chicago Style (17th ed.) Citation
Head, A. K., P. Humble, L. M. Clarebrough, A. J. Morton, and C. T. Forwood. Computed Electron Micrographs and Defect Identification. AmsterdamNew York, N.Y.: NorthHollandAmerican Elsevier, 1973.
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MLA (9th ed.) Citation
Head, A. K., et al. Computed Electron Micrographs and Defect Identification. NorthHollandAmerican Elsevier, 1973.
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Warning: These citations may not always be 100% accurate.