Computed electron micrographs and defect identification.

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Bibliographic Details
Main Author:	Head, A. K.
Other Authors:	Humble, P., Clarebrough, L. M., Morton, A. J., Forwood, C. T.
Format:	Book
Published:	AmsterdamNew York, N.Y. : NorthHollandAmerican Elsevier, 1973.
Series:	Series defects in crystalline solids, v. <7>
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