X-ray microscopy and X-ray microanalysis

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Bibliographic Details
Corporate Author: 2nd International Symposium X-Ray Microscopy and X-Ray Microanalysis stockholm, England
Other Authors: Engstrôm, A. (Ed.), Cosslett, V. (Ed.), Pattee, h. (Ed.)
Format: Conference Proceeding Book
Published: Amsterdam: Elsevier, 1960.
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Description
Physical Description:x, 542 p.: graf., fot.;