Practical scanning electron microscopy: electron and ion microprobe analysis.
Saved in:
| Other Authors: | , , , , , |
|---|---|
| Format: | Book |
| Published: |
New York and London :
Plenum press,
1977.
|
| Edition: | 3a ed. |
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|
MARC
| LEADER | 00000nam a2200000 a 4500 | ||
|---|---|---|---|
| 003 | AR-SmCIES | ||
| 005 | 20221027150838.0 | ||
| 008 | 170703s19771975n ado r e en eng | ||
| 999 | |c 19825 |d 19825 | ||
| 020 | |a 0306308207 | ||
| 040 | |c AR-SmCIES | ||
| 041 | 7 | |a en |2 ISO 639-1 | |
| 091 | |a 28406 | ||
| 245 | 1 | 0 | |a Practical scanning electron microscopy: |b electron and ion microprobe analysis. |
| 250 | |a 3a ed. | ||
| 260 | |a New York and London : |b Plenum press, |c 1977. | ||
| 300 | |a xxiii, 582 p. : |b il., graf., fot.; | ||
| 650 | 4 | |a MICROSCOPIA ELECTRONICA |9 3457 | |
| 650 | 7 | |a ELECTRON BEAMS |2 INIST |9 3316 | |
| 650 | 7 | |a HACES ELECTRONICOS |2 INIST |9 3317 | |
| 650 | 7 | |a SCANNING ELECTRON |2 INIST |9 4314 | |
| 650 | 7 | |a X-RAY EMISSION ANALYSIS |2 INIST |9 4315 | |
| 650 | 7 | |a ANALISIS POR EMISION DE RAYOS X |2 INIST |9 4316 | |
| 650 | 7 | |a SONDAS ELECTRONICAS |2 INIST |9 4317 | |
| 650 | 4 | |a ELECTRON PROBES |2 INIST |9 4318 | |
| 700 | 1 | |a Yakowitz, Harvey |e Ed. |9 4319 | |
| 700 | |a Goldstein, Joseph. |e Ed. |9 3650 | ||
| 700 | |a Newbury, Dale E. |9 3651 | ||
| 700 | |a Lifshin, E. |9 4320 | ||
| 700 | |a Colby, J. W. |9 4321 | ||
| 700 | |a Coleman, J. R. |9 4322 | ||
| 942 | |2 udc |c BK | ||
| 952 | |0 0 |1 0 |2 udc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |d 2018-02-20 |i 28406 |o 537.533.35 G578 ej.2 |p 28406 |r 2018-02-20 00:00:00 |t 2 |w 2018-02-20 |y BK | ||
| 952 | |0 0 |1 0 |2 udc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |d 2022-10-27 |i 27739 |o 537.533.35 G578 |p 27739 |r 2022-10-27 00:00:00 |w 2022-10-27 |y BK | ||