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Practical scanning electron microscopy: electron and ion microprobe analysis.

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Other Authors: Yakowitz, Harvey (Ed.), Goldstein, Joseph (Ed.), Newbury, Dale E., Lifshin, E., Colby, J. W., Coleman, J. R.
Format: Book
Published: New York and London : Plenum press, 1977.
Edition:3a ed.
Subjects:
MICROSCOPIA ELECTRONICA
ELECTRON BEAMS
HACES ELECTRONICOS
SCANNING ELECTRON
X-RAY EMISSION ANALYSIS
ANALISIS POR EMISION DE RAYOS X
SONDAS ELECTRONICAS
ELECTRON PROBES
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Physical Description:xxiii, 582 p. : il., graf., fot.;
ISBN:0306308207

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