IEEE transactions on reliability

Saved in:
Bibliographic Details
Format: Journal
Language:English
Published: New York, N.Y. : INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (IEEE),
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!

MARC

LEADER 00000nas a2200000 a 4500
008 170703c1996####nyuu||p#r||||#00|#||eng#d
003 AR-SmCIES
022 |a 0018-9529 
210 0 |a IEEE TRANS. RELIAB. 
222 0 |a IEEE transactions on reliability 
245 0 0 |a IEEE transactions on reliability 
260 |a New York, N.Y. :  |b INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (IEEE), 
653 |a CONTROL; CIBERNETICA; AUTOMATIZACION 
653 |a INGENIERIA ELECTRICA; INGENIERIA MECANICA 
999 |c 12247  |d 12247