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The influence of experimental resolution and bakground upon ion-induced (ve = vi) electron distribution measured behind solid foils.

Fil: Chiu, K. C. R. Comisión Nacional de Energía Atómica; Argentina

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Main Authors: Chiu, K. C. R., Meckbach, W., Sánchez Sarmiento, G., Mc Gowan, J. W.
Language:English
Published: IOP Publishing 1979
Subjects:
DISTRIBUTION CONSTANTS
IONS
CHARGE DISTRIBUTION
ION BEAMS
ATOMIC BEAMS
Online Access:https://nuclea.cnea.gob.ar/handle/20.500.12553/1988
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Summary:Fil: Chiu, K. C. R. Comisión Nacional de Energía Atómica; Argentina

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