Trace characterization. Chemical and physical.

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Bibliographic Details
Corporate Authors: Materials Research Symposium Gaithersburg, Md., Institute for Materials Research (U.S.A.)
Other Authors: Meinke, W. Wayne (ed.), Scribner, Bourdon Francis (ed.)
Format: Conference Proceeding Book
Language:English
Published: Washington: Dept. of Commerce (National Bureau of Standards), 1967
Series:NBS Monograph ; 100.
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111 2 |a Materials Research Symposium  |n (1st :  |d 1966 :  |c Gaithersburg, Md.)  |9 10749 
245 1 0 |a Trace characterization. Chemical and physical. 
260 |a Washington:   |b Dept. of Commerce (National Bureau of Standards),   |c 1967 
300 |a xviii, 580 p.  |b ilustraciones; gráficos; tablas;  
490 1 |a National Bureau of Standards Monograph   |x N°100 
500 |a Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966. 
504 |a Includes bibliographies. 
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700 1 |a Meinke, W. Wayne,  |e ed.  |9 10751 
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