Defect analysis in elctron microscopy

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Bibliographic Details
Main Author:	Loretto, M. H.
Other Authors:	Smallman, R. E.
Format:	Book
Language:	English
Published:	Londres: Chapman and Hall, 1975.
Subjects:	MICROSCOPIA ELECTRONICA ELECTRON MICROSCOPY DEFECTOS DIFRACCION ELECTRONICA DEFECTOS CRISTALINOS TRANSMISSION ELECTRON MICROSCOPY MICROSCOPIA ELECTRONICA POR TRANSMISION DISLOCATIONS KIKUCHI LINES LINEAS DE KIKUCHI
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100	1	0	\|a Loretto, M. H. \|9 4369
245	1	0	\|a Defect analysis in elctron microscopy
260			\|a Londres: \|b Chapman and Hall, \|c 1975.
300			\|a ix, 134 p.: \|b graf., il., fot.;
650		7	\|2 INIST \|9 3457 \|a MICROSCOPIA ELECTRONICA
650		7	\|2 INIST \|9 3456 \|a ELECTRON MICROSCOPY
650		7	\|2 INIST \|9 61 \|a DEFECTOS
650		7	\|2 INIST \|9 4354 \|a DIFRACCION ELECTRONICA
650		7	\|2 INIST \|9 1166 \|a DEFECTOS CRISTALINOS
650		7	\|2 INIST \|a TRANSMISSION ELECTRON MICROSCOPY \|9 4370
650		7	\|2 INIST \|a MICROSCOPIA ELECTRONICA POR TRANSMISION \|9 4371
650		7	\|2 INIST \|9 3980 \|a DISLOCATIONS
650		7	\|2 INIST \|9 3946 \|a KIKUCHI LINES
650		7	\|2 INIST \|a LINEAS DE KIKUCHI \|9 4372
700			\|a Smallman, R. E. \|9 4373
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