Multiple-beam interferometry of surfaces and films.

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Bibliographic Details
Main Author: Tolansky, Samuel. [from old catalog]
Format: Book
Language:English
Published: Oxford : Clarendon Press, 1948.
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008 841120s1948 enka r 001 0 eng d
999 |c 32775  |d 32775 
040 |a DLC  |c CarP  |d DLC 
080 |a 535.417 
100 1 |a Tolansky, Samuel. [from old catalog]  |9 2936 
245 0 0 |a Multiple-beam interferometry of surfaces and films.  
260 |a Oxford :  |b Clarendon Press,  |c 1948. 
300 |a viii, 187 p.  |c 23 cm. 
504 |a índice y bibliografía al final del volúmen. 
942 |2 ddc  |c BK