Materials characterization using nondestructive evaluation (NDE) methods /
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| Other Authors: | , , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Amsterdam ; Boston :
Elsevier/Woodhead Publishing,
c2016.
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| Series: | Woodhead Publishing series in electronic and optical materials ;
no. 88. |
| Subjects: | |
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Table of Contents:
- 1. Atomic force microscopy (AFM) for materials characterization / M.K. Khan, Q.Y. Wang, M.E. Fitzpatrick. 2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization / B.J. Inkson. 3. X-ray microtomography for materials characterization / R. Hanke, T. Fuchs, M. Salamon, S. Zabler. 4. X-ray diffraction (XRD) techniques for materials characterization / J. Epp. 5. Microwave, millimeter wave and terahertz (MMT) techniques for materials characterization / C. Sklarczyk. 6. Acoustic microscopy for materials characterization / R.Gr. Maev. 7. Ultrasonic techniques for materials characterization
- G. Hübschen. 8. Electromagnetic techniques for materials characterization / I. Altpeter, R. Tschuncky, K. Szielasko. 9. Hybrid methods for materials characterization / R. Tschuncky, K. Szielasko, I. Altpeter.