Part I: fourth annual SEM symposium and Part II: Workshop on forensic applications of the SEM...

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Bibliographic Details
Corporate Author: Symposium on scanning electron microscope Chicago,US
Format: Conference Proceeding Book
Language:English
Published: Chicago : IIT Research institute, 1971.
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3rd Floor Main Library

Holdings details from 3rd Floor Main Library
Call Number: A1234.567
Copy 1 Available