Structure and properties of thin films [Proceedings].

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Bibliographic Details
Corporate Author: International conference on structure and properties of thin films Bolton Landing, NY,US
Format: Conference Proceeding Book
Language:English
Published: New York : J. Wiley and sons, 1959.
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Description
Item Description:BibliografĂ­a al final de cada artĂ­culo
Physical Description:561 p. : il.