Physical measurements and analysis of thin films: Progress in analytical chemistry.

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Bibliographic Details
Main Author: Murt, E. M. (ed)
Other Authors: Guldner, W. G. (ed)
Format: Book
Language:English
Published: New York : Plenum Press, 1969.
Series:Simmons, I. L.
Lublin, P.
PROGRESS in analytical chemistry
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LEADER 00000nam a2200000 a 4500
008 170703s1969####nyu||||f#|||||00| 0#eng#d
003 AR-SmCIES
041 7 |a en   |2 ISO 639-1 
091 |a 349 PMM 
092 |a V.2 
100 1 |a Murt, E. M.  |e ed 
245 1 0 |a Physical measurements and analysis of thin films: Progress in analytical chemistry. 
260 |a New York :  |b Plenum Press,  |c 1969. 
490 1 |a PROGRESS in analytical chemistry 
700 1 |a Guldner, W. G.  |e ed 
800 1 |a Simmons, I. L.  |e ed 
800 1 |a Lublin, P.  |e ed 
830 |a PROGRESS in analytical chemistry 
999 |c 21437  |d 21437 
952 |0 0  |1 0  |2 udc  |4 0  |7 0  |a CIES-CAC  |b CIES-CAC  |d 2018-02-20  |i 349 PMM  |o 539.23 M  |p 349 PMM  |r 2018-02-20 00:00:00  |t V.2  |w 2018-02-20  |y BK