X-ray optics and microanalysis.

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Bibliographic Details
Main Author:	Beaman, D. R. et al (ed)
Corporate Authors:	Microbean analysis society, International congress on x-ray optics and microanalysis
Format:	Conference Proceeding Book
Published:	Midland : Pendell publ., 1980.
Subjects:	MICROSCOPIA ELECTRONICA -CONGRESOS MICROSCOPIOS ELECTRONICOS DE BARRIDO
Online Access:	View in OPAC
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100	1		\|a Beaman, D. R. et al \|e ed
710	2		\|a Microbean analysis society
245	1	0	\|a X-ray optics and microanalysis.
260			\|a Midland : \|b Pendell publ., \|c 1980.
300			\|a 665 p.
650		4	\|a MICROSCOPIA ELECTRONICA -CONGRESOS
650		4	\|a MICROSCOPIOS ELECTRONICOS DE BARRIDO
711	2		\|a International congress on x-ray optics and microanalysis \|n 8 \|c Boston, Mass.,US \|d 1977
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