Crystal structure of thin oxide films grown on ZrNb alloys studied by RHEED [Reflection High Energy Electron Diffraction].

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Bibliographic Details
Main Author: Khatamian, D.
Corporate Author: Atomic Energy of Canada Limited^pCA
Other Authors: Lalonde, S. D.
Format: Book
Language:English
Published: Chalk River, Ontario : AECL, 1996.
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Description
Item Description:Bibliografía: p.56
Physical Description:13 p. : tabla, diagr.
ISBN:0660167026
ISSN:00670367