Non-destructive testing.

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Bibliographic Details
Main Author: Boogaard, J. (ed.)
Corporate Author: World conference on non-destructive testing
Other Authors: Dijk, G. M. van (ed.)
Format: Conference Proceeding Book
Language:English
Published: Amsterdam : Elsevier, 1989.
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3rd Floor Main Library

Holdings details from 3rd Floor Main Library
Call Number: A1234.567
Copy 1 Available