Scanning; international journal of scanning electron microscopy and related methods
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| Format: | Journal |
|---|---|
| Language: | English |
| Published: |
New York, N.Y. :
G. Witzstrock Publ. House,
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| Subjects: | |
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MARC
| LEADER | 00000nas a2200000 a 4500 | ||
|---|---|---|---|
| 008 | 170703d19801989nyub||p#r||||#00|#||eng#d | ||
| 003 | AR-SmCIES | ||
| 022 | |a 0161-0457 | ||
| 222 | 0 | |a Scanning; international journal of scanning electron microscopy and related methods | |
| 245 | 0 | 0 | |a Scanning; international journal of scanning electron microscopy and related methods |
| 260 | |a New York, N.Y. : |b G. Witzstrock Publ. House, | ||
| 310 | |a Bimestral | ||
| 590 | |a 1980-84, 3-6 trimestral | ||
| 653 | |a ELECTRONICA | ||
| 999 | |c 12795 |d 12795 | ||
| 952 | |0 0 |1 0 |2 udc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |d 2018-02-20 |h 1989, 11 (1). |r 2018-02-20 00:00:00 |w 2018-02-20 |y CR | ||
| 952 | |0 0 |1 0 |2 udc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |d 2018-02-20 |h 1986-88,8-10 |r 2018-02-20 00:00:00 |w 2018-02-20 |y CR | ||
| 952 | |0 0 |1 0 |2 udc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |d 2018-02-20 |h 1985, 7 (1, 3-6) |r 2018-02-20 00:00:00 |w 2018-02-20 |y CR | ||
| 952 | |0 0 |1 0 |2 udc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |d 2018-02-20 |h 1984, 6 (1-2, 4) |r 2018-02-20 00:00:00 |w 2018-02-20 |y CR | ||
| 952 | |0 0 |1 0 |2 udc |4 0 |7 0 |a CIES-CAC |b CIES-CAC |d 2018-02-20 |h 1980-83,3-5 |r 2018-02-20 00:00:00 |w 2018-02-20 |y CR | ||