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  1. 1
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    Bipolar resistive switching on TiO2/Au by conducting Atomic Force Microscopy by Linares Moreau, M. M., Levy, Pablo Eduardo, López Mir, L., Ghenzi, Nestor, Golmar, Federico, Granja, Leticia Paula, Ocal, C., Levy, Pablo Eduardo

    Published 2019
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  2. 2
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    Integrated Photonic Optomechanical Atomic Force Microscopy Probes Batch Fabricated Using Deep UV Photolithography by Perez, Diego Javier, Wang, Mingkang, Madhaven, Venkatesh, Sathisivan, Mogana, Tay, Charlie, Aksyuk, Vladimir A.

    Published 2023
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    Materials characterization using nondestructive evaluation (NDE) methods /

    Published c2016.
    “…Atomic force microscopy (AFM) for materials characterization /…”
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