Search Results - "RUTHERFORD BACKSCATTERING SPECTROSCOPY"

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    The recrystallization of ion-implanted silicon layers. II: Implant species effect. by Christodoulides, C. E., Baragiola, R. A., Chivers, D., Grant, W. A., Williams, J. S.

    Published 1978
    Subjects: “…RUTHERFORD BACKSCATTERING SPECTROSCOPY…”
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    Topographical and Physicochemical Contrast in Photopatterned SU-8 Films for Microfabrication of Multilayer Structures by Salazar Alarcón, L., Martínez,E. D., Rodríguez, L. M., Pastoriza, H.

    Published 2016
    Subjects: “…Rutherford backscattering spectroscopy…”
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