Search Results - "CMOS technology"

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    Displacement Damage in CMOS Image Sensors After Thermal Neutron Irradiation by Alcalde Bessia, F., Pérez, M., Sofo Haro, M., Sidelnik, I., Blostein, J.J., Suárez, S., Pérez, P., Gómez Berisso, M., Lipovetzky, J.

    Published 2018
    Subjects: “…CMOS technology…”
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