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    Resistive switching in ferromagnetic La2/3Ca1/3MnO3 thin films by Alposta, Ignacio, Kalstein, Ariel, Ghenzi, Néstor, Bengió, Silvina, Zampieri, Guillermo Enrique, Rubi, Diego, Levy, Pablo Eduardo

    Published 2013
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    Evolution of the gate current in 32 nm MOSFETs under irradiation by Palumbo, Félix Roberto Mario, Debray, Mario Ernesto, Vega, Nahuel Agustín, Quinteros, Cynthia Paula, Kalstein, Ariel, Guarin, F.

    Published 2016
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