Palumbo, F. R. M., Aguirre, F. L., Pazos, S. M., Krylov, I., Winter, R., & Eizenberg, M. (2018). Influence of the spatial distribution of border traps in the capacitance frequency dispersion of Al2O3/InGaAs. Pergamon-Elsevier Science Ltd.
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Chicago Style (17th ed.) Citation
Palumbo, Félix Roberto Mario, Fernando Leonel Aguirre, Sebastián Matías Pazos, Igor Krylov, Roy Winter, and Moshe Eizenberg. Influence of the Spatial Distribution of Border Traps in the Capacitance Frequency Dispersion of Al2O3/InGaAs. Pergamon-Elsevier Science Ltd, 2018.
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MLA (9th ed.) Citation
Palumbo, Félix Roberto Mario, et al. Influence of the Spatial Distribution of Border Traps in the Capacitance Frequency Dispersion of Al2O3/InGaAs. Pergamon-Elsevier Science Ltd, 2018.
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Warning: These citations may not always be 100% accurate.