rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Defect analysis in elctron microscopy
  name:
    name part: Loretto, M. H.
    role:
      role term: creator
  name:
    name part: Smallman, R. E.
  type of resource: text
  origin info:
    place:
      place term: eng
    place:
      place term: Londres
    publisher: Chapman and Hall
    date issued: 1975
    issuance: monographic
  language:
    language term: eng
  physical description:
    extent: ix, 134 p.: graf., il., fot.;
  subject:
    topic: MICROSCOPIA ELECTRONICA
  subject:
    topic: ELECTRON MICROSCOPY
  subject:
    topic: DEFECTOS
  subject:
    topic: DIFRACCION ELECTRONICA
  subject:
    topic: DEFECTOS CRISTALINOS
  subject:
    topic: TRANSMISSION ELECTRON MICROSCOPY
  subject:
    topic: MICROSCOPIA ELECTRONICA POR TRANSMISION
  subject:
    topic: DISLOCATIONS
  subject:
    topic: KIKUCHI LINES
  subject:
    topic: LINEAS DE KIKUCHI
  identifier: 0412137607
  record info:
    record creation date: 221104
    record change date: 20221104152823.0