rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Diffraction and imaginig techniques in material science
  name:
    name part: Amelinckx, S.
    role:
      role term: Ed.
  name:
    name part: Gevers, R.
    role:
      role term: Ed.
  name:
    name part: Van Landuyt, J.
    role:
      role term: Ed.
  type of resource: text
  origin info:
    place:
      place term: eng
    place:
      place term: Amsterdam
    publisher: North-Holland
    date issued: 1978
    copyright date: 1970
    edition: 2a ed
    issuance: monographic
  language:
    language term: eng
  physical description:
    extent: vol II, ix, 457-847 p.: fot., graf.;
  subject:
    topic: MICROSCOPIA ELECTRONICA
  subject:
    topic: ELECTRON MICROSCOPY
  subject:
    topic: LOW ENERGY ELECTRON DIFFRACTION
  subject:
    topic: DIFRACCION DE ELECTRONES DE BAJA ENERGIA
  subject:
    topic: DIFRACCION DE RAYOS X
  subject:
    topic: X-RAY DIFFRACTION
  subject:
    topic: FIELD EMISSION MICROSCOPY
  subject:
    topic: MICROSCOPIA DE EMISION DE CAMPO
  subject:
    topic: MIRROR ELECTRON MICROSCOPY
  identifier: 0444851291
  record info:
    record creation date: 221028
    record change date: 20221028160319.0